报告题目： Probing structure and electronic structure at atomic scale by quantitative and analytical STEM

报告人： 王毅， 单位： 德国马克斯普朗克固体研究所--斯图加特电镜研究中心
报告时间： 2019年5月29号下午3点
报告地点：环化大楼 501

报告摘要：
The marked progress of the instrumentation hardware has made scanning transmission electron microscope (STEM) imaging and spectroscopy at atomic resolution readily possible nowadays. But still, the acquisition and interpretation of these data can be problematic due to heavy image distortion and poor signal-to-noise ratio.

In this seminar, I will present the development of STEM imaging acquisition, data processing, and image quantification procedures, which improve STEM image measurement precision to picometer-scale. Shifting to analytical regime, by combining multi-frame spectrum imaging and automatic energy-offset correction, I developed a spectrum imaging technique, which suppresses image distortion and improves the signal-to-noise ratio. Finally, I will show some examples on using these quantitative and analytical STEM techniques to probe the structural, chemical and electronic properties at atomic scale in the fields of functional oxides and energy-related materials.